Research Article

Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device

Figure 2

The identified damage locations: (Dam ) damaged on 1st storey, (Dam ) damaged on 2nd storey, (Dam ) damaged on 3rd storey, and (Dam ) damaged on 1st, 3rd, and 5th storey.
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