Journals
Publish with us
Publishing partnerships
About us
Blog
The Scientific World Journal
Journal overview
For authors
For reviewers
For editors
Table of Contents
Special Issues
The Scientific World Journal
/
2014
/
Article
/
Tab 1
/
Research Article
Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device
Table 1
The processing time of embedded FFT and FRF for different data lengths.
Data length
512
1024
2048
4096
FFT
0.089 s
0.193 s
0.442 s
0.970 s
FRF
0.032 s
0.064 s
0.130 s
0.259 s
Total
0.121 s
0.256 s
0.572 s
1.229 s