Adaptive Random Testing with Combinatorial Input Domain

<table class="table-group" width="800px"><tr class="fig-image" id="a"><td><img alt="843248.fig.001a" src="https://static.hindawi.com/articles/tswj/volume-2014/843248/figures/843248.fig.001a.jpg"/></td></tr><tr class="fig-caption"><td align="center"><table><tr><td><b>(a) </b>Point pattern</td></tr></table></td></tr><tr class="fig-image" id="b"><td><img alt="843248.fig.001b" src="https://static.hindawi.com/articles/tswj/volume-2014/843248/figures/843248.fig.001b.jpg"/></td></tr><tr class="fig-caption"><td align="center"><table><tr><td><b>(b) </b>Strip pattern</td></tr></table></td></tr><tr class="fig-image" id="c"><td><img alt="843248.fig.001c" src="https://static.hindawi.com/articles/tswj/volume-2014/843248/figures/843248.fig.001c.jpg"/></td></tr><tr class="fig-caption"><td align="center"><table><tr><td><b>(c) </b>Block pattern</td></tr></table></td></tr></table>

<table>Three types of failure patterns with two-dimensional input domain.</table>

The Scientific World Journal

Adaptive Random Testing with Combinatorial Input Domain

Figure 1