VLSI Design

VLSI Design / 1996 / Article

Open Access

Volume 5 |Article ID 061747 | https://doi.org/10.1155/1996/61747

Bhanu Kapoor, V. S. S. Nair, "Improving Path Sensitizability of Combinational Circuits", VLSI Design, vol. 5, Article ID 061747, 9 pages, 1996. https://doi.org/10.1155/1996/61747

Improving Path Sensitizability of Combinational Circuits

Received30 May 1994
Accepted14 Oct 1994


The problem of modifying a synthesized circuit to improve its path sensitizability has been investigated. It is shown that a large number of paths, that cannot be sensitized using single-transition tests, are redundant paths and they can be removed by appropriate modification of the circuit. The effect of these modifications on area and performance of the circuit has been analyzed. For the paths which are neither redundant nor sensitizable using single-transition tests, it is shown that they can be sensitized using multiple-transition tests. Results obtained on some common benchmark examples suggest the validity and viability of this approach.

Copyright © 1996 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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