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VLSI Design
Volume 5 (1997), Issue 3, Pages 223-240

Application of Dynamic Supply Current Monitoring to Testing Mixed-Signal Circuits

1Etisalat College of Engineering, P.O. Box 980, Sharjah, United Arab Emirates
2School of Electronic & Electrical Engineering, University of Bath, Claverton Down, Bath BA2 7AY, UK

Copyright © 1997 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


This paper applies the time-domain testing technique and compares the effectiveness of transient voltage and dynamic power supply current measurements in detecting faults in CMOS mixed-signal circuits. The voltage and supply current (iDDT) measurements are analyzed by three methods to detect the presence of a fault, and to establish which measurement achieves higher confidence in the detection. Catastrophic, soft and stuck-at single fault conditions were introduced to the circuit-under-test (CUT). The time-domain technique tests a mixed-signal CUT in a unified fashion, thereby eliminating the need to partition the CUT into separate analogue and digital modules.