Table of Contents
VLSI Design
Volume 5, Issue 3, Pages 223-240

Application of Dynamic Supply Current Monitoring to Testing Mixed-Signal Circuits

1Etisalat College of Engineering, P.O. Box 980, Sharjah, United Arab Emirates
2School of Electronic & Electrical Engineering, University of Bath, Claverton Down, Bath BA2 7AY, UK

Copyright © 1997 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [1 citation]

The following is the list of published articles that have cited the current article.

  • Mahmoud A. Al-Qutayri, “System level testing of analog functions in a mixed-signal circuit,” Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, vol. 2, pp. 1026–1029, 2000. View at Publisher · View at Google Scholar