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VLSI Design
Volume 8, Issue 1-4, Pages 13-19
http://dx.doi.org/10.1155/1998/10649

Monte Carlo Simulations of Impact Ionization Feedback in MOSFET Structures

Bell Labs, Lucent Technologies, 600 Mountain Avenue, Murray Hill, 07974, NJ, USA

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Jeff D. Bude, “Monte Carlo Simulations of Impact Ionization Feedback in MOSFET Structures,” VLSI Design, vol. 8, no. 1-4, pp. 13-19, 1998. https://doi.org/10.1155/1998/10649.