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VLSI Design

VLSI Design / Published Special Issues / Special Issue

Computational Electronics

Status
Published
Guest Editors
Wolfgang Porod

Computational Electronics

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Articles

  • Special Issue
  • - Volume 8
  • - Article ID 019078

Hydrodynamic (HD) Simulation of N-Channel MOSFET's with a Computationally Efficient Inversion Layer Quantization Model

Haihong Wang | Wei-Kai Shih | ... | Al. F. Tasch
  • Special Issue
  • - Volume 8
  • - Article ID 060536

Simulation of Bistable Laser Diodes with lnhomogeneous Excitation

Gang Fang | Ting-Wei Tang
  • Special Issue
  • - Volume 8
  • - Article ID 021494

Convergence Properties of the Bi-CGSTAB Method for the Solution of the 3D Poisson and 3D Electron Current Continuity Equations for Scaled Si MOSFETs

D. Vasileska | W. J. Gross | ... | D. K. Ferry
  • Special Issue
  • - Volume 8
  • - Article ID 074761

A Generalized Monte Carlo Approach for the Analysis of Quantum-Transport Phenomena in Mesoscopic Systems: Interplay Between Coherence and Relaxation

Fausto Rossi | Stefano Ragazzi | ... | Paolo Lugli
  • Special Issue
  • - Volume 8
  • - Article ID 092597

Semiconductor Device Noise Computation Based on the Deterministic Solution of the Poisson and Boltzmann Transport Equations

Alfredo J. Piazza | Can E. Korman
  • Special Issue
  • - Volume 8
  • - Article ID 030974

Inclusion of Bandstructure and Many-Body Effects in a Quantum Well Laser Simulator

F. Oyafuso | P. von Allmen | ... | K. Hess
  • Special Issue
  • - Volume 8
  • - Article ID 058129

New “Irreducible Wedge” for Scattering Rate Calculations in Full-Zone Monte Carlo Simulations

John Stanley | Neil Goldsman
  • Special Issue
  • - Volume 8
  • - Article ID 039048

Cellular Automaton Study of Time-Dynamics of Avalanche Breakdown in IMPATT Diodes

G. Zandler | R. Oberhuber | ... | P. Lugli
  • Special Issue
  • - Volume 8
  • - Article ID 023567

Interface Roughness Effects in Ultra-Thin Tunneling Oxides

D. Z.-Y. Ting | Erik S. Daniel | T. C. Mcgill
  • Special Issue
  • - Volume 8
  • - Article ID 027313

Modeling of Shot Noise in Resonant Tunneling Structures

G. Iannaccone | M. Macucci | B. Pellegrini