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VLSI Design
Volume 8, Issue 1-4, Pages 454-461
http://dx.doi.org/10.1155/1998/73698

Impact Ionization and Hot-Electron Injection Derived Consistently from Boltzmann Transport

California Institute of Technology, Pasadena 91125, CA, USA

Received 28 May 1997

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Paul Hasler, Andreas G. Andreou, Chris Diorio, Bradley A. Minch, and Carver A. Mead, “Impact Ionization and Hot-Electron Injection Derived Consistently from Boltzmann Transport,” VLSI Design, vol. 8, no. 1-4, pp. 454-461, 1998. https://doi.org/10.1155/1998/73698.