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Edwin C. Kan, Gyoyoung Jin, Zhiping Yu, Robert W. Dutton, "Observation of Anomalous Negative Differential Resistance in Diode Breakdown Simulation Using Carrier Temperature Dependent Impact Ionization", VLSI Design, vol. 6, Article ID 076350, 4 pages, 1998. https://doi.org/10.1155/1998/76350
Observation of Anomalous Negative Differential Resistance in Diode Breakdown Simulation Using Carrier Temperature Dependent Impact Ionization
Abstract
When carrier temperatures are used to model impact ionization with self-consistent cooling effects, anomalous negative differential resistance (NDR) was found in diode breakdown simulation. Possible mechanisms responsible for the NDR are analyzed.
Copyright
Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
