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VLSI Design
Volume 11, Issue 2, Pages 149-159
http://dx.doi.org/10.1155/2000/60904

Configurable 2-D Linear Feedback Shift Registers for VLSI Built-in Self-test Designs

Department of Electrical Engineering, Wright State University, Dayton 45435, OH, USA

Received 20 May 1999; Accepted 13 October 1999

Copyright © 2000 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Chien-In Henry Chen and Yingjie Zhou, “Configurable 2-D Linear Feedback Shift Registers for VLSI Built-in Self-test Designs,” VLSI Design, vol. 11, no. 2, pp. 149-159, 2000. https://doi.org/10.1155/2000/60904.