Table of Contents
VLSI Design
Volume 2008, Article ID 418165, 10 pages
http://dx.doi.org/10.1155/2008/418165
Research Article

Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems

School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA

Received 29 October 2007; Accepted 17 February 2008

Academic Editor: Bozena Kaminska

Copyright © 2008 Vishwanath Natarajan et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, and Abhjit Chatterjee, “Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems,” VLSI Design, vol. 2008, Article ID 418165, 10 pages, 2008. https://doi.org/10.1155/2008/418165.