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VLSI Design
Volume 2008, Article ID 657207, 8 pages
http://dx.doi.org/10.1155/2008/657207
Research Article

Simple Evaluation of the Nonlinearity Signature of an ADC Using a Spectral Approach

Centro Nacional de Microelectrónica (CNM-CSIC), Instituto de Microelectrónica de Sevilla (IMSE), University of Sevilla, Edificio CICA, Avenue Reina Mercedes s/n, 41012 Sevilla, Spain

Received 17 October 2007; Revised 30 March 2008; Accepted 16 May 2008

Academic Editor: Marcelo Lubaszewski

Copyright © 2008 E. J. Peralías et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [9 citations]

The following is the list of published articles that have cited the current article.

  • Bryce Minger, Guillaume Ferre, Dominique Dallet, Eric Grivel, and Loic Fuchey, “An improved spectral approach to estimate the integral non-linearity of analog-to-digital converters,” 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, pp. 1129–1134, . View at Publisher · View at Google Scholar
  • Jalón, and Peralías, “ADC non-linearity low-cost test through a simplified double-histogram method,” 2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop, IMS3TW '09, 2009. View at Publisher · View at Google Scholar
  • M. A. Jalon, and E. Peralias, “ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method,” Journal of Electronic Testing-Theory and Applications, vol. 26, no. 1, pp. 47–58, 2010. View at Publisher · View at Google Scholar
  • Manuel J. Barragán, Gloria Huertas, Adoratión Rueda, and José L. Huertas, “(Some) open problems to incorporate BIST in complex heterogeneous integrated systems,” Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010, pp. 8–13, 2010. View at Publisher · View at Google Scholar
  • Bernard, Azaïs, Comte, Potin, Kerzerho, and Renovell, “Adaptive LUT-based system for in situ ADC auto-correction,” Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010, 2010. View at Publisher · View at Google Scholar
  • Vincent Kerzérho, Vincent Fresnaud, Dominique Dallet, Serge Bernard, and Lilian Bossuet, “Fast digital post-processing technique for integral nonlinearity correction of analog-to-digital converters: Validation on a 12-bit folding-and- interpolating analog-to-digital converter,” IEEE Transactions on Instrumentation and Measurement, vol. 60, no. 3, pp. 768–775, 2011. View at Publisher · View at Google Scholar
  • Kook, Gomes, Jin, Wheelright, and Chatterjee, “Optimal linearity testing of sigma-delta based incremental ADCs using restricted code measurements,” Proceedings - 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2011, pp. 72–77, 2011. View at Publisher · View at Google Scholar
  • Sehun Kook, Hyun Woo Choi, and Abhijit Chatterjee, “Low-resolution DAC-driven linearity testing of higher resolution ADCs using polynomial fitting measurements,” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 21, no. 3, pp. 454–464, 2013. View at Publisher · View at Google Scholar
  • Eduardo Peralías, Antonio Ginés, and Adóracion Rueda, “INL systematic reduced-test technique for Pipeline ADCs,” Proceedings - 2014 19th IEEE European Test Symposium, ETS 2014, 2014. View at Publisher · View at Google Scholar