Table of Contents Author Guidelines Submit a Manuscript
VLSI Design
Volume 2010, Article ID 670476, 9 pages
http://dx.doi.org/10.1155/2010/670476
Review Article

Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds?—A Survey

1Department of Electronics and Communication, Nirma University, Ahmedabad 382481, India
2Space Application Center, ISRO, Ahmedabad 380015, India

Received 23 July 2009; Revised 17 November 2009; Accepted 11 January 2010

Academic Editor: Avi Ziv

Copyright © 2010 Usha S. Mehta et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [9 citations]

The following is the list of published articles that have cited the current article.

  • Yingbo Zhou, and Jishun Kuang, “A sort method to enhance significant spectral components of test set,” 2016 12th International Conference on Natural Computation, Fuzzy Systems and Knowledge Discovery (ICNC-FSKD), pp. 2147–2151, . View at Publisher · View at Google Scholar
  • S. Sivanantham, Jincy P. Manuel, K. Sarathkumar, P.S. Mallick, and J. Raja Paul Perinbam, “Reduction of Test Power and Test Data Volume by Power Aware Compression Scheme,” 2012 International Conference on Advances in Computing and Communications, pp. 158–161, . View at Publisher · View at Google Scholar
  • Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee, and Kushal Choksi, “Hamming distance based distributed scan chain reordering for test power optimization,” 2010 Annual IEEE India Conference (INDICON), pp. 1–5, . View at Publisher · View at Google Scholar
  • Usha S. Mehta, Niranjan M. Devashrayee, and Kanker S. Dasgupta, “Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression method,” 2010 International Symposium on System on Chip, pp. 1–7, . View at Publisher · View at Google Scholar
  • Usha Mehta, K. S. Dasgupta, and N. M. Devashrayee, “Weighted Transition Based Reordering, Columnwise Bit Filling, and Difference Vector: A Power-Aware Test Data Compression Method,” VLSI Design, vol. 2011, pp. 1–8, 2011. View at Publisher · View at Google Scholar
  • Azadeh Safari, Fujimi Bentley, and Yinan Kong, “Operational capability and suitability of image compression methods for different applications,” Canadian Conference on Electrical and Computer Engineering, 2014. View at Publisher · View at Google Scholar
  • Usha Sandeep Mehta, and Harikrishna Parmar, “Improvement in error resilience for compressed VLSI test data using Hamming code based technique,” 2015 International Conference on VLSI Systems, Architecture, Technology and Applications, VLSI-SATA 2015, 2015. View at Publisher · View at Google Scholar
  • Ji-Shun Kuang, Ying-Bo Zhou, and Shuo Cai, “Adaptive EFDR coding method for test data compression,” Dianzi Yu Xinxi Xuebao/Journal of Electronics and Information Technology, vol. 37, no. 10, pp. 2529–2535, 2015. View at Publisher · View at Google Scholar
  • Shuo Cai, Yinbo Zhou, Peng Liu, Fei Yu, and Wei Wang, “A novel test data compression approach based on bit reversion,” IEICE Electronics Express, 2017. View at Publisher · View at Google Scholar