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VLSI Design
Volume 2010, Article ID 670476, 9 pages
http://dx.doi.org/10.1155/2010/670476
Review Article

Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds?—A Survey

1Department of Electronics and Communication, Nirma University, Ahmedabad 382481, India
2Space Application Center, ISRO, Ahmedabad 380015, India

Received 23 July 2009; Revised 17 November 2009; Accepted 11 January 2010

Academic Editor: Avi Ziv

Copyright © 2010 Usha S. Mehta et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Usha S. Mehta, Kankar S. Dasgupta, and Niranjan M. Devashrayee, “Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds?—A Survey,” VLSI Design, vol. 2010, Article ID 670476, 9 pages, 2010. https://doi.org/10.1155/2010/670476.