Research Article
Test Generation for Crosstalk-Induced Delay Faults in VLSI Circuits Using Modified FAN Algorithm
Table 3
The ISCAS’85 and scan version of ISCAS’89 circuit characteristics.
| Circuit | Number of inputs | Number of outputs | Number of Gates | Number of paths | Number of critical paths | Number of victims | Total target faults |
| c17 | 5 | 2 | 6 | 11 | 6 | 7 | 42 | c432 | 36 | 7 | 160 | 83926 | 2199 | 103 | 9327 | c880 | 60 | 26 | 383 | 8642 | 92 | 70 | 9279 | c499 | 41 | 32 | 202 | 9440 | 14 | 207 | 21879 | c1908 | 33 | 25 | 880 | 729057 | 32 | 93 | 25916 | s27 | 7 | 4 | 10 | 28 | 6 | 10 | 74 | s208 | 19 | 10 | 96 | 145 | 2 | 18 | 743 | s208.1 | 18 | 9 | 104 | 142 | 1 | 12 | 558 | s298 | 17 | 20 | 119 | 231 | 1 | 10 | 537 | s526 | 24 | 27 | 193 | 410 | 1 | 10 | 891 | s386 | 13 | 13 | 159 | 207 | 10 | 49 | 4195 | s510 | 25 | 13 | 211 | 369 | 1 | 13 | 1098 | s420.1 | 34 | 17 | 218 | 474 | 1 | 14 | 1276 | s1196 | 32 | 32 | 529 | 3097 | 9 | 55 | 10630 | s1238 | 32 | 32 | 508 | 3558 | 30 | 45 | 5822 | s13207.1 | 700 | 790 | 7951 | 1345319 | 565 | 188 | 241743 | s15850.1 | 611 | 684 | 9772 | 164738035 | 8238 | 341 | 240814 |
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