Test Generation for Crosstalk-Induced Delay Faults in VLSI Circuits Using Modified FAN Algorithm

Table 4

Comparison of results between FAN and PODEM.

Circuit name	Number of fanout points	% Of average aggressors activated	Average number of back-traces		% Decrease in average number of back traces	CPU time (sec)		Fault coverage (%)
			FAN	PODEM		FAN	PODEM	FAN	PODEM
c17	3	73	5.15	8.461	39.13	0.000	0.000	92	90
c432	89	94	132.054	216.518	39.01	338.05	389.2	80	79
c499	59	98	163.789	233.418	29.83	816.35	3040.1	71	46
c880	125	97	314.460	436.56	27.97	1268.5	3145.9	80	30
c1908	384	80	646.377	842.28	23.21	3762.3	5786.5	15	7
s27	4	81	9.593	12.218	21.48	0.000	0.000	83	58
s208	32	91	89.029	101.208	12.03	1.400	1.550	68	42
s208.1	28	86	89.55	103.93	13.83	0.65	0.900	10	43
s298	34	94	76.104	161.886	52.99	3.733	5.500	85	59
s526	54	95	132.353	301.284	56.07	13.21	19.433	86	84
s386	26	80	102.88	206.06	50.07	15.26	21.8	62	77
s510	73	88	156.615	218.48	28.32	13.15	23.05	65	47
s420.1	58	93	175.67	189.69	7.39	9.3	13.58	22	12
s1196	155	85	508.99	558.26	8.83	1404	2862.4	62	52
s1238	165	91	424.97	658.28	35.44	704.5	710.15	87	86
Average					29.66	554	1001.3	64.53	54.13