VLSI Design

VLSI Design / 2012 / Article / Tab 4

Research Article

Test Generation for Crosstalk-Induced Delay Faults in VLSI Circuits Using Modified FAN Algorithm

Table 4

Comparison of results between FAN and PODEM.

Circuit nameNumber of fanout points% Of average aggressors activatedAverage number of back-traces% Decrease in average number of back tracesCPU time (sec)Fault coverage (%)
FANPODEMFANPODEMFANPODEM

c173735.158.46139.130.0000.0009290
c4328994132.054216.51839.01338.05389.28079
c4995998163.789233.41829.83816.353040.17146
c88012597314.460436.5627.971268.53145.98030
c190838480646.377842.2823.213762.35786.5157
s274819.59312.21821.480.0000.0008358
s208329189.029101.20812.031.4001.5506842
s208.1288689.55103.9313.830.650.9001043
s298349476.104161.88652.993.7335.5008559
s5265495132.353301.28456.0713.2119.4338684
s3862680102.88206.0650.0715.2621.86277
s5107388156.615218.4828.3213.1523.056547
s420.15893175.67189.697.399.313.582212
s119615585508.99558.268.8314042862.46252
s123816591424.97658.2835.44704.5710.158786

Average     29.665541001.364.5354.13

Article of the Year Award: Outstanding research contributions of 2020, as selected by our Chief Editors. Read the winning articles.