Research Article
Test Generation for Crosstalk-Induced Delay Faults in VLSI Circuits Using Modified FAN Algorithm
Table 6
Comparison with previous works.
| Circuit name | Previous work [6] | Previous work [12] | Previous work [13] | Proposed ATPG | % Fault coverage | Time(s) | % Fault coverage | Time(s) | % Fault coverage | Time(s) | % Fault coverage | Time(s) |
| c432 | 35 | 1019 | 15 | 4 hr 42 min | — | — | 80 | 338.05 | c880 | 28 | 1553 | 38 | 2 hr 27 min | 54.26 | 0.1 | 80 | 1268.5 | c1355 | 16 | 3173 | 36 | 3 hr 48 min | — | — | 33 | 1865.8 | c1908 | 33 | 2562 | 8 | 10 hr 40 min | 24.34 | 360 | 15 | 3762.3 | c5315 | 31 | 7030 | 1 | 24 hr 10 min | 49 | 7.85 | 57 | 7151.2 | c7552 | 14 | 8424 | 2 | 28 hr 26 min | 52 | 1326.6 | 68 | 9867.03 |
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