Journals
Publish with us
Publishing partnerships
About us
Blog
VLSI Design
Table of Contents
Special Issues
VLSI Design
/
2017
/
Article
/
Tab 3
/
Research Article
Oscillation-Based Test Applied to a Wideband CCII
Table 3
Short circuit fault results for all the five technology corners.
Tech corner
N1-N2
N4–N11
N6–N8
(%)
(%)
(%)
(%)
(%)
(%)
FF
2,05%
−8,69%
21,11%
185,35%
−3,42%
240,96%
FS
0,27%
39,42%
23,84%
154,12%
−3,40%
200,16%
SF
1,13%
−56,43%
16,83%
159,10%
−6,37%
211,71%
SS
−2,47%
0,71%
20,04%
129,33%
−5,69%
171,85%
TT
0,53%
−0,55%
20,94%
158,88%
−4,24%
207,59%