VLSI Design

VLSI Testing


Status
Published

Guest Editors
Sunil Das

VLSI Testing

Articles

  • Special Issue
  • - Volume 1
  • - Article ID 069351

Editorial

  • Special Issue
  • - Volume 1
  • - Article ID 076586

Overlapped Subarray Segmentation: An Efficient Test Method for Cellular Arrays

Earl E. Swartzlander | Miroslaw Malek
  • Special Issue
  • - Volume 1
  • - Article ID 081360

Built-In Self-Test: Milestones and Challenges

Jacob Savir | Paul H. Bardell
  • Special Issue
  • - Volume 1
  • - Article ID 026728

Guest Editorial

Sunil R. Das
  • Special Issue
  • - Volume 1
  • - Article ID 034963

Theory, Analysis and Implementation of an On-Line BIST Technique

Rajiv Sharma | Kewal K. Saluja
  • Special Issue
  • - Volume 1
  • - Article ID 073024

About the Editor in Chief and the Guest Editor

  • Special Issue
  • - Volume 1
  • - Article ID 089495

Computer-Aided Testing Systems: Evaluation and Benchmark Circuits

Samiha Mourad
  • Special Issue
  • - Volume 1
  • - Article ID 042309

Coverage of Node Shorts Using Internal Access and Equivalence Classes

Warren H. Debany
  • Special Issue
  • - Volume 1
  • - Article ID 038536

Analysis and Design of Regular Structures for Robust Dynamic Fault Testability

Michael J. Bryan | Srinivas Devadas | Kurt Keutzer
  • Special Issue
  • - Volume 1
  • - Article ID 084924

Conditional Disconnection Probability in Star Graphs

Walid Najjar | Pradip K. Srimani