Design of Shock Wave Storage and Test System with Variable Parameters Based on the Sensor of Piezoelectric Circuit

Table 6

Two shape structures on the test results increase.

Num	Disc bump	Pen bump	PC environment	Hadoop	Distributed
1	1.93	1.43	0.74	1.4	1.27
2	3.34	1.13	2.05	3.26	1.22
3	5.38	5.41	5.97	5.87	5.83
4	1.18	4.09	4.46	2.15	1.62
5	1.41	1.81	2.82	1.76	2.2
6	5.73	5.8	2.08	1.1	3.42
7	4.87	5.31	1.1	3.44	1.69