Image Analysis Technology in the Detection of Particle Size Distribution and the Activity Effect of Low-Silicon Copper Tailings

<table class="figure-group"><tr class="fig-image" id="a"><td><object data="https://static.hindawi.com/articles/wcmc/volume-2021/9057264/figures/9057264.fig.009a.svgz" name="9057264.fig.009a" type="image/svg+xml"></object></td></tr><tr class="fig-caption"><td><b>(a) </b>Cumulative distribution of LSC tailing particle size</td></tr><tr class="fig-image" id="b"><td><object data="https://static.hindawi.com/articles/wcmc/volume-2021/9057264/figures/9057264.fig.009b.svgz" name="9057264.fig.009b" type="image/svg+xml"></object></td></tr><tr class="fig-caption"><td><b>(b) </b>PSD of LSC tailings</td></tr></table>

<div>Laser particle size analyser test results of LSC tailings.</div>

Wireless Communications and Mobile Computing

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Figure 9

Figure 9: Image Analysis Technology in the Detection of Particle Size Distribution and the Activity Effect of Low-Silicon Copper Tailings 