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Advances in Materials Science and Engineering
Volume 2013 (2013), Article ID 548329, 5 pages
http://dx.doi.org/10.1155/2013/548329
Research Article

Charge-Trapping Devices Using Multilayered Dielectrics for Nonvolatile Memory Applications

1Department of Electrical Engineering and Institute of Electronics Engineering, National Tsing-Hua University, Hsinchu 300, Taiwan
2Department of Electronic Engineering, Ming Chuan University, Taoyuan 333, Taiwan

Received 6 August 2013; Revised 31 October 2013; Accepted 2 November 2013

Academic Editor: Tung-Ming Pan

Copyright © 2013 Wen-Chieh Shih et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Wen-Chieh Shih, Chih-Hao Cheng, Joseph Ya-min Lee, and Fu-Chien Chiu, “Charge-Trapping Devices Using Multilayered Dielectrics for Nonvolatile Memory Applications,” Advances in Materials Science and Engineering, vol. 2013, Article ID 548329, 5 pages, 2013. doi:10.1155/2013/548329