Journals
Publish with us
Publishing partnerships
About us
Blog
Advances in Materials Science and Engineering
Journal overview
For authors
For reviewers
For editors
Table of Contents
Special Issues
Advances in Materials Science and Engineering
/
2013
/
Article
/
Fig 5
/
Research Article
Crack Detection in Single-Crystalline Silicon Wafer Using Laser Generated Lamb Wave
Figure 5
(a) Orientation in a (100) wafer and (b) the setup of the laser source and the laser interferometer.
(a)
(b)