Research Article

Optimization of the Cathode Arc Plasma Deposition Processing Parameters of ZnO Film Using the Grey-Relational Taguchi Method

Table 6

Results of confirmation test for multiple performance characteristics of ZnO thin films.

ResistivityTransmittance
Experiment number 9 (A3 B2 C1)

  Ω-cm88.17%

Grey-relational prediction design (A3 B1 C1)
  Ω-cm88.82%