Electrical Characterization of Sol-Gel Derived TiO<sub>2</sub> Film on c-Si Substrate by Admittance Measurement

<table>Raw (denoted as symbol) and deconvoluted (designated as lines) FTIR spectra of TiO<sub>2</sub> film, deposited on c-Si substrate.</table>

Advances in Materials Science and Engineering

Figure 2: Electrical Characterization of Sol-Gel Derived TiO<sub>2</sub> Film on c-Si Substrate by Admittance Measurement 