Advances in Materials Science and Engineering / 2014 / Article / Fig 4

Research Article

Fabrication of Ni-Mn Microprobe Structure with Low Internal Stress and High Hardness by Employing DC Electrodeposition

Figure 4

The cross-sectional micrographs of TEM examinations on the coatings prepared at different current densities: (a) 2 A/dm2, (b) 8 A/dm2, (c) 10 A/dm2, and (d) 12 A/dm2. Single arrow denotes the direction of columnar grain, while double arrows indicate the presence of twins. The corresponding insets are the SAED patterns measured at location of pointed arrows.
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