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Advances in Materials Science and Engineering
Volume 2015, Article ID 290593, 7 pages
Research Article

Element Analysis Based on Energy-Dispersive X-Ray Fluorescence

College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, 29 Yudao Street, Nanjing 210016, China

Received 30 August 2015; Revised 13 November 2015; Accepted 16 November 2015

Academic Editor: Santiago Garcia-Granda

Copyright © 2015 Min Yao et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Energy-dispersive X-ray fluorescence (EDXRF) spectrometry is a nondestructive, rapid, multielement, highly accurate, and environment friendly analysis compared with other elemental detection methods. Thus, EDXRF spectrometry is applicable for production quality control, ecological environment monitoring, geological surveying, food inspection, and heritage analysis, among others. A hardware platform for the EDXRF spectrometer is designed in this study based on the theoretical analysis of energy-dispersive X-ray. The platform includes a power supply subsystem, an optical subsystem, a control subsystem, and a personal computer. A fluorescence spectrum analytical method is then developed to obtain the category and content of elements in a sample. This method includes qualitative and quantitative analyses. Finally, a series of experiments is performed. Results show that the precision of the proposed measurement method is below 8%, whereas its repeatability is below 2%.