Advances in Materials Science and Engineering / 2015 / Article / Fig 6

Research Article

The Microstructures and Electrical Resistivity of (Al, Cr, Ti)FeCoNiOx High-Entropy Alloy Oxide Thin Films

Figure 6

Plot of the resistivity of the thin films versus annealing times. The annealing temperatures for the FCNO, TFCNO, CFCNO, and AFCNO thin film were 1000°C, 1000°C, 700°C, and 800°C, respectively.