Advances in Materials Science and Engineering / 2015 / Article / Fig 2

Research Article

Ellipsometric Analysis of Cadmium Telluride Films’ Structure

Figure 2

Range of possible values of refractive index and index of extinction (a, curves), calculated for CdTe films on silicon; comparison of experimental data with calculated dependence of ellipsometric parameters and on the film thickness (b). Numbers near markers specify film thickness in nm. Numbers 1 and 2 indicate solution number.

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