Advances in Materials Science and Engineering / 2015 / Article / Fig 3

Research Article

Ellipsometric Analysis of Cadmium Telluride Films’ Structure

Figure 3

Range of possible values for the refractive index and index of extinction (a; curves), calculated for CdTe films on CdHgTe; comparison of experimental data with calculated dependence of ellipsometric parameters and on film thickness (b). Numbers near markers specify the film thickness in nm. Numbers 1 and 2 indicate solution number.
(a)
(b)

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