Advances in Materials Science and Engineering / 2015 / Article / Tab 2

Research Article

Ellipsometric Analysis of Cadmium Telluride Films’ Structure

Table 2

Refractive index , index of extinction , and CdTe film thickness , calculated using the one-layer model; refractive index , index of extinction , and thickness of the outer layer and thickness of the inner layer, calculated using the two-layer model ( nm).

Film numberOne-layer modelTwo-layer model
, nm, nm, nm

CdTe films on Si
F12.400.3583–852.66–2.690.18–0.0540–60 10–30
F22.320.45650–602.350.025–0.22530–4013–27
F32.7150.25180–1102.80.19607–40
F42.360.22260–702.410.13506–20
F52.81.25~1202.2750.0251205

CdTe films on CdHgTe
F62.670.33345–702.650.2253511–27
F72.3720.67180–822.350.0687020–30
F830.380–1052.620.121005–25
F92.550.4394–1052.350.166035–40
F102.81.190–1402.30.0410015–20

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