Ellipsometric Analysis of Cadmium Telluride Films’ Structure

Table 2

Refractive index , index of extinction , and CdTe film thickness , calculated using the one-layer model; refractive index , index of extinction , and thickness of the outer layer and thickness of the inner layer, calculated using the two-layer model ( nm).

Film number	One-layer model			Two-layer model
			, nm			, nm	, nm
CdTe films on Si
F1	2.40	0.35	83–85	2.66–2.69	0.18–0.05	40–60	10–30
F2	2.32	0.456	50–60	2.35	0.025–0.225	30–40	13–27
F3	2.715	0.251	80–110	2.8	0.19	60	7–40
F4	2.36	0.222	60–70	2.41	0.13	50	6–20
F5	2.8	1.25	~120	2.275	0.025	120	5
CdTe films on CdHgTe
F6	2.67	0.333	45–70	2.65	0.225	35	11–27
F7	2.372	0.671	80–82	2.35	0.068	70	20–30
F8	3	0.3	80–105	2.62	0.12	100	5–25
F9	2.55	0.43	94–105	2.35	0.16	60	35–40
F10	2.8	1.1	90–140	2.3	0.04	100	15–20