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Advances in Materials Science and Engineering
Volume 2017, Article ID 5826527, 5 pages
Research Article

The Effect of Stress in the Density of States of Amorphous Carbon Films Determined by X-Ray Excited Auger Electron Spectroscopy

1Faculdade de Tecnologia “Arthur de Azevedo” (FATEC), Rod. Deputado Nagib Chaib 380, 13808-300 Mogi Mirim, SP, Brazil
2Centro Universitário Adventista de São Paulo (UNASP), Campus de Engenheiro Coelho (EC), Estrada Municipal Pastor Walter Boger, s/n, Lagoa Bonita, 13165-000 Engenheiro Coelho, SP, Brazil
3Instituto de Física “Gleb Wataghin”, Universidade Estadual de Campinas (UNICAMP), Caixa Postal 6165, Cidade Universitária, 13083-970 Campinas, SP, Brazil

Correspondence should be addressed to F. C. Marques; rb.pmacinu.ifi@seuqram

Received 30 March 2017; Revised 23 June 2017; Accepted 11 July 2017; Published 8 August 2017

Academic Editor: David Holec

Copyright © 2017 P. F. Barbieri and F. C. Marques. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Amorphous carbon films can be prepared with a large variety of structure and have been used in a number of technological applications. Many of their properties have been determined, but very little is known concerning the effect of pressure on their properties. In this work we investigate the influence of pressure of graphite-like amorphous carbon films on the density of states (DOS) using X-ray Excited Auger Electron Spectroscopy (XAES) and the second derivate method of the XAES. The films were deposited by ion beam deposition and simultaneously bombarded with argon, which is responsible for the variation of the film stress, reaching extremely high values (4.5 GPa). Marked variations of the density of states of the , , sp, and s components were observed with increasing stress.