Research Article

The Effect of Stress in the Density of States of Amorphous Carbon Films Determined by X-Ray Excited Auger Electron Spectroscopy

Figure 3

(a) Second derivative of the XAES KVV from a-C thin films with different pressure (stress). The Fermi energy was determined using C 1s in 284.3 eV. The very intense peak at approximately 240.5 eV is due to excitation of C 1s core by Kα of O adsorbed on the anode of the X-ray tube. (b) Kinetic energy of the valence states as a function of the carbon film stress in amorphous carbon. The dotted lines are guides to the eyes.
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