Determination of Optical Properties of Thin Films from Ketteler-Helmholtz Dispersion Relations: Application to the Case of Ultraviolet Irradiated Zirconium Oxide

<div class="floats-full-page floats-full-page-figure"><h2>Figure 6</h2><div class="floats-full-page-caption"><div>Comparison of experimental spectra with theory.</div></div><div class="floats-full-page-content"><table class="figure-group"><tr class="fig-image"><td><object data="https://static-01.hindawi.com/articles/amse/volume-2017/8285230/figures/8285230.fig.006.svgz" name="8285230.fig.006" type="image/svg+xml"></object></td></tr></table></div></div>

Figure 6 | Determination of Optical Properties of Thin Films from Ketteler-Helmholtz Dispersion Relations: Application to the Case of Ultraviolet Irradiated Zirconium Oxide

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Figure 6: Determination of Optical Properties of Thin Films from Ketteler-Helmholtz Dispersion Relations: Application to the Case of Ultraviolet Irradiated Zirconium Oxide

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Figure 6

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<p><em>Advances in Materials Science and Engineering </em>publishes research in all areas of materials science and engineering, including the synthesis and properties of materials, and their applications in engineering applications.</p>


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<p>Chief Editor, Amit Bandyopadhyay, is based at Washington State University and is interested in &nbsp;the fields of additive manufacturing or 3D printing of advanced materials. His current research is focused on metal additive manufacturing, biomedical devices and multi‑materials structures.</p>


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