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Advances in Materials Science and Engineering
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Advances in Materials Science and Engineering
/
2017
/
Article
/
Fig 7
/
Research Article
Frequency Dependence of
Characteristics of MOS Capacitors Containing Nanosized High-
κ
Ta
2
O
5
Dielectrics
Figure 7
C-V
characteristics at 100 kHz and 1 MHz, obtained in serial measurement mode for an Al gate.