Advances in Materials Science and Engineering / 2018 / Article / Fig 7

Research Article

Synchrotron Radiation X-Ray Absorption Spectroscopy and Spectroscopic Ellipsometry Studies of InSb Thin Films on GaAs Grown by Metalorganic Chemical Vapor Deposition

Figure 7

(a) Comparative reflective index (n) and (b) comparative extinction coefficient (k) for five InSb/GaAs samples, deduced from SE Ψ and Δ data in Figure 1.