Synchrotron Radiation X-Ray Absorption Spectroscopy and Spectroscopic Ellipsometry Studies of InSb Thin Films on GaAs Grown by Metalorganic Chemical Vapor Deposition

<div>(a) Comparative reflective index (<i>n</i>) and (b) comparative extinction coefficient (<i>k</i>) for five InSb/GaAs samples, deduced from SE Ψ and Δ data in Figure <a href="../fig1/">1</a>.</div>

Advances in Materials Science and Engineering

fig7

Figure 7

Figure 7: Synchrotron Radiation X-Ray Absorption Spectroscopy and Spectroscopic Ellipsometry Studies of InSb Thin Films on GaAs Grown by Metalorganic Chemical Vapor Deposition 

Figure 7 | Synchrotron Radiation X-Ray Absorption Spectroscopy and Spectroscopic Ellipsometry Studies of InSb Thin Films on GaAs Grown by Metalorganic Chemical Vapor Deposition 