Novel Low-Permittivity (Mg_1−xCu_x)₂SiO₄ Microwave Dielectric Ceramics

Figure 1

(a) XRD patterns of (Mg_1−xCu_x)₂SiO₄ (x = 0.05–0.20) ceramics sintered at 1300°C for 4 h; (b) locally magnified peak profiles indicated in (a); (c) the lattice parameters as a function of the x value.

(a)

(b)

(c)