Novel Low-Permittivity (Mg<sub>1−<i>x</i></sub>Cu<sub><i>x</i></sub>)<sub>2</sub>SiO<sub>4</sub> Microwave Dielectric Ceramics

<div>The dielectric constant <span class="nowrap"><svg height="9.14241pt" id="M25" style="vertical-align:-3.1815pt" version="1.1" viewbox="-0.0498162 -5.96091 9.09249 9.14241" width="9.09249pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M387 375C387 402 357 448 257 448C172 448 82 404 82 326C82 289 108 255 156 241V239C85 223 23 181 23 116C23 39 89 -12 182 -12C265 -12 336 31 378 91L361 114C320 73 269 47 216 47C157 47 115 82 115 137C115 191 160 219 218 219C243 219 262 218 272 217L304 259L302 266C295 265 281 264 255 264C195 264 163 294 163 335C163 377 200 416 249 416C293 416 321 389 329 342C331 332 335 329 341 329C355 329 387 352 387 375Z" id="g113-247"></path></g><g transform="matrix(.0091,0,0,-0.0091,5.005,3.132)"><path d="M185 344V453C137 433 92 421 41 413V386C100 378 104 375 104 310V106C104 41 97 35 33 30V0H268V30C190 35 185 41 185 107V283C206 340 240 371 267 371C282 371 296 364 310 351C316 344 325 343 336 348C357 357 369 378 369 399C369 424 345 451 310 451C262 451 219 397 187 344H185Z" id="g58-112"></path></g></svg>,</span> quality factor <span class="nowrap"><svg height="12.7178pt" id="M26" style="vertical-align:-3.42947pt" version="1.1" viewbox="-0.0498162 -9.28833 31.3687 12.7178" width="31.3687pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M699 368C699 549 574 666 407 666C186 666 23 488 23 277C23 113 129 -3 288 -13L307 -26C431 -111 501 -139 533 -147C559 -154 613 -163 658 -164L666 -141C597 -111 507 -66 430 -11L416 -1C580 42 699 190 699 368ZM601 371C601 227 518 54 381 22L354 40L278 24C175 47 120 145 120 269C120 451 235 631 398 631C540 631 601 521 601 371Z" id="g113-82"></path></g><g transform="matrix(.013,0,0,-0.013,12.292,0)"><path d="M528 54L331 254L528 455L492 493L294 291L96 493L60 455L257 254L60 54L96 16L294 217L492 16L528 54Z" id="g117-42"></path></g><g transform="matrix(.013,0,0,-0.013,22.828,0)"><path d="M619 670C619 686 593 712 555 712S459 686 410 634S335 504 320 430H250L219 400L222 388H312L258 73C223 -133 201 -166 187 -180C175 -191 158 -199 140 -199C123 -199 88 -188 74 -172C68 -166 63 -164 54 -171C38 -185 23 -201 23 -215C23 -236 60 -261 93 -261C122 -261 161 -247 207 -200C268 -138 300 -71 337 94C365 220 376 277 394 387L501 399L521 430H401C432 623 464 665 501 665C524 665 544 651 567 627C577 617 583 618 592 625C601 631 619 651 619 670Z" id="g113-103"></path></g></svg>,</span> and temperature coefficient of resonant frequency <svg height="9.14241pt" id="M27" style="vertical-align:-3.1815pt" version="1.1" viewbox="-0.0498162 -5.96091 9.6327 9.14241" width="9.6327pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M471 456L444 459C426 433 414 430 388 430C324 430 270 434 216 434C103 434 51 374 23 338L43 317C96 366 146 380 221 375L154 109C149 86 147 68 147 52C147 4 168 -12 197 -12C240 -12 291 25 334 71L320 96C295 75 268 58 252 58C238 58 227 79 238 138C251 211 272 296 292 372C310 372 332 368 350 368C391 368 421 369 434 371C444 388 455 413 471 456Z" id="g113-241"></path></g><g transform="matrix(.0091,0,0,-0.0091,5.434,3.132)"><path d="M56 439L27 407L32 396H103V106C103 41 96 35 31 30V0H271V29C191 37 184 40 184 110V396H293C304 404 309 428 303 439H184V473C183 558 195 604 207 623S234 653 261 653C293 653 322 635 341 616C350 607 360 606 370 614C381 622 386 631 389 638C394 652 393 664 384 675C366 696 339 708 303 710C263 705 225 686 190 655C137 608 121 561 114 538S103 487 103 456V439H56Z" id="g58-100"></path></g></svg> of (Mg<sub>0.95</sub>Cu<sub>0.05</sub>)<sub>2</sub>SiO<sub>4</sub> with 12% B<sub>2</sub>O<sub>3</sub>–LiF as a function of sintering temperature.</div>

Advances in Materials Science and Engineering

fig5

Figure 5

Figure 5: Novel Low-Permittivity (Mg<sub>1−<i>x</i></sub>Cu<sub><i>x</i></sub>)<sub>2</sub>SiO<sub>4</sub> Microwave Dielectric Ceramics 

Advances in Materials Science and Engineering

Novel Low-Permittivity (Mg1−xCux)2SiO4 Microwave Dielectric Ceramics

Figure 5

Novel Low-Permittivity (Mg_1−xCu_x)₂SiO₄ Microwave Dielectric Ceramics