Advances in Materials Science and Engineering / 2018 / Article / Fig 2

Research Article

Structural, Optical, and Electrical Characterization of β-Ga2O3 Thin Films Grown by Plasma-Assisted Molecular Beam Epitaxy Suitable for UV Sensing

Figure 2

(a) Film thickness dependence on the substrate temperature at fluxes of 1.5 and 1.0 sccm; (b) dispersion curves of the refractive index.

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