High Reliability and Fast-Speed Phase-Change Memory Based on Sb<sub>70</sub>Se<sub>30</sub>/SiO<sub>2</sub> Multilayer Thin Films

<div>The Kubelka–Munk function of amorphous SbSe and SbSe (1 nm) SiO (9 nm) multilayer thin films.</div>

Advances in Materials Science and Engineering

Figure 3: High Reliability and Fast-Speed Phase-Change Memory Based on Sb<sub>70</sub>Se<sub>30</sub>/SiO<sub>2</sub> Multilayer Thin Films 