Role of Cobalt Doping on the Physical Properties of CdO Nanocrystalline Thin Films for Optoelectronic Applications

Table 1

Powder X-ray diffractogram parameters for the Cd_1 − xCo_xO thin films.

Sample (%)	(h k l) value	2θ (deg)	FWHM	dh k l (Å)	Lattice constant (Å)	Crystallite size “D” (nm)	Internal strain “ε”	Dislocation density “δ” × 10^15 (W)
CdO	(1 1 1)	33.01	0.8053	2.71	4.6959	17.95	0.67	3.10
	(2 0 0)	38.37	0.7269	2.34	4.6864	20.18	0.52	2.45
Cd0.99Co0.01O	(1 1 1)	33.04	0.8793	2.70	4.6902	16.44	0.74	3.69
	(2 0 0)	38.47	0.9065	2.33	4.6750	16.19	0.64	3.81
Cd0.95Co0.05O	(1 1 1)	33.07	0.8962	2.70	4.6860	16.13	0.75	3.84
	(2 0 0)	38.56	0.9458	2.33	4.6638	15.52	0.67	4.15
Cd0.90Co0.10O	(1 1 1)	33.09	0.9154	2.70	4.6836	15.79	0.77	4.01
	(2 0 0)	38.71	1.4345	2.32	4.6468	10.24	1.02	9.53