Research Article
Role of Cobalt Doping on the Physical Properties of CdO Nanocrystalline Thin Films for Optoelectronic Applications
Table 1
Powder X-ray diffractogram parameters for the Cd1 − xCoxO thin films.
| Sample (%) | (h k l) value | 2θ (deg) | FWHM | dh k l (Å) | Lattice constant (Å) | Crystallite size “D” (nm) | Internal strain “ε” | Dislocation density “δ” × 1015 (W) |
| CdO | (1 1 1) | 33.01 | 0.8053 | 2.71 | 4.6959 | 17.95 | 0.67 | 3.10 | (2 0 0) | 38.37 | 0.7269 | 2.34 | 4.6864 | 20.18 | 0.52 | 2.45 |
| Cd0.99Co0.01O | (1 1 1) | 33.04 | 0.8793 | 2.70 | 4.6902 | 16.44 | 0.74 | 3.69 | (2 0 0) | 38.47 | 0.9065 | 2.33 | 4.6750 | 16.19 | 0.64 | 3.81 |
| Cd0.95Co0.05O | (1 1 1) | 33.07 | 0.8962 | 2.70 | 4.6860 | 16.13 | 0.75 | 3.84 | (2 0 0) | 38.56 | 0.9458 | 2.33 | 4.6638 | 15.52 | 0.67 | 4.15 |
| Cd0.90Co0.10O | (1 1 1) | 33.09 | 0.9154 | 2.70 | 4.6836 | 15.79 | 0.77 | 4.01 | (2 0 0) | 38.71 | 1.4345 | 2.32 | 4.6468 | 10.24 | 1.02 | 9.53 |
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