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ElectroComponent Science and Technology
Volume 3, Issue 1, Pages 51-62
http://dx.doi.org/10.1155/APEC.3.51

An Experimental Investigation of the Dielectric Properties of Thermally Evaporated Rare Earth Oxides for Use in Thin Film Capacitors

1Department of Physics, Auburn University, Auburn, Alabama 36830, USA
2189 Grandview Avenue, Valparaiso, Florida 32580, USA

Received 25 July 1975; Accepted 30 January 1976

Copyright © 1976 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

A. T. Fromhold, Jr. and W. D. Foster, “An Experimental Investigation of the Dielectric Properties of Thermally Evaporated Rare Earth Oxides for Use in Thin Film Capacitors,” ElectroComponent Science and Technology, vol. 3, no. 1, pp. 51-62, 1976. https://doi.org/10.1155/APEC.3.51.