Active and Passive Electronic Components

Active and Passive Electronic Components / 1977 / Article
Special Issue

The First European Hybrid Microelectronics Conference. Part II

View this Special Issue

Open Access

Volume 4 |Article ID 289208 | https://doi.org/10.1155/APEC.4.193

R. E. Cote, R. C. Headley, J. T. Herman, A. Howe, "Factors Affecting Laser-Trim Stability of Thick Film Resistors", Active and Passive Electronic Components, vol. 4, Article ID 289208, 11 pages, 1977. https://doi.org/10.1155/APEC.4.193

Factors Affecting Laser-Trim Stability of Thick Film Resistors

Received14 Jun 1977

Abstract

Various factors affecting precision of trim and resistor stability are considered. The influence of machine operating parameters (beam power, pulse frequency and trim speed) on resistor performance are examined and quantified through statistically designed experiments for a Q-switched YAG laser system. Laser kerf quality is examined by scanning electron microscopy and related to kerf isolation resistance measurements. A relatively simple, production oriented, quality control test is proposed for rapid determination of kerf electrical stability. In addition, the effect of cut design and extent of trim on precision and stability are discussed.

Copyright © 1977 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


More related articles

 PDF Download Citation Citation
 Order printed copiesOrder
Views190
Downloads1475
Citations

Article of the Year Award: Outstanding research contributions of 2020, as selected by our Chief Editors. Read the winning articles.