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ElectroComponent Science and Technology
Volume 4 (1977), Issue 3-4, Pages 193-203
http://dx.doi.org/10.1155/APEC.4.193

Factors Affecting Laser-Trim Stability of Thick Film Resistors

1E. I. du Pont de Nemours & Co., Inc., Photo Products Department, Electronic Materials Division, Niagara Falls, New York, USA
2E. I. du Pont de Nemours & Co. Inc., Engineering Department, Wilmington, Delaware, USA
3Teradyne lncorporated, Chicago, Illinois, USA

Received 14 June 1977

Copyright © 1977 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

R. E. Cote, R. C. Headley, J. T. Herman, and A. Howe, “Factors Affecting Laser-Trim Stability of Thick Film Resistors,” ElectroComponent Science and Technology, vol. 4, no. 3-4, pp. 193-203, 1977. doi:10.1155/APEC.4.193