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ElectroComponent Science and Technology
Volume 8 (1981), Issue 3-4, Pages 175-180

Failure Mechanisms That Cause High Electrical Leakage in Multilayer Ceramic Capacitors

1Kita-Itami Works, Mitsubishi Electric Corporation, ltami 664, Japan
2Central Research Laboratory, Mitsubishi Electric Corporation, Amagasaki 661, Japan
3Manufacturing Development Laboratory, Mitsubishi Electric Corporation, Amagasaki 661, Japan

Copyright © 1981 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


The causes of failure mechanisms of multilayer ceramic capacitors that result in zero resistance (shorts) or low resistance (high leakage) behaviour in the capacitors when the capacitors are subjected to low voltages have been studied. It has been found that failures resulted from the electrochemical reaction of electrode materials in the microscopic open pores which pass across a ceramic layer between inner electrodes and are filled with water containing Cl ions. The mechanism found in this investigation has been applied to enable screening processes to be evolved for manufactured capacitors to eliminate the possibility of failure and hence to improve the reliability of circuits using multilayer ceramic capacitors.