Table of Contents Author Guidelines Submit a Manuscript
ElectroComponent Science and Technology
Volume 8, Issue 3-4, Pages 189-197
http://dx.doi.org/10.1155/APEC.8.189

Thick Film Temperature Compensating Circuit for Semiconductor Strain Gauges

1Production Engineering Research Laboratory, Hitachi Ltd, Japan
2Naka Works, Hitachi Ltd, Japan

Copyright © 1981 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Hideo Arima, Akira Ikegami, Hiromi Tosaki, Mitsuo Ai, Yoshitaka Matsuoka, and Tsutomu Okayama, “Thick Film Temperature Compensating Circuit for Semiconductor Strain Gauges,” ElectroComponent Science and Technology, vol. 8, no. 3-4, pp. 189-197, 1981. https://doi.org/10.1155/APEC.8.189.