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ElectroComponent Science and Technology
Volume 10, Issue 4, Pages 277-284

The Influence of Conductor Particle Size Distribution on the Blending Curve of Epoxy-Based Thick Film Resistors

1Department of Electrical Engineering, University of Edinburgh, Edinburgh, Scotland
2Physics Dept., University of Edinburgh, Edinburgh, Scotland

Accepted 24 March 1982

Copyright © 1983 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


The influence of conductor particle size distribution on the blending curve of epoxy-based thick film resistors has been investigated. It was found that the critical volume fraction shifts to higher values as the spread of the conductor particle size distribution decreases. The results are interpreted in terms of a model whose main parameter is the contact probability for the conductor particles.