Active and Passive Electronic Components

Active and Passive Electronic Components / 1983 / Article

Open Access

Volume 10 |Article ID 954501 | 4 pages | https://doi.org/10.1155/APEC.10.63

Temperature Verification of Hybrid Microelectronic Circuit Design

Received03 Oct 1981
Accepted28 Oct 1981

Abstract

The paper includes temperature measurement results on hybrid microelectronic circuit surfaces carried out by infrared microscope with special attention to critical temperatures (hot spots) which may require hybrid microelectronic circuit redesign. Critical component reliability analysis, as well as the need for replacement with more reliable components is considered. The principle for hybrid microelectronic design verification suggested.The paper is the result of longterm efforts at the Rudi Čajavec Factory in Banja Luka, where we have been investigating the possibilities for very reliable hybrid microelectronic circuit design.

Copyright © 1983 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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